MRI
MRI India Journals Vol. 13 No. 1 (2024)

Deep Learning Approaches for Predictive Maintenance in Industrial Systems

Authors

  • James Nolan Beacon Technical University
  • Susan Reynolds Pinnacle Engineering School

DOI:

https://doi.org/10.65521/itsi-teee.v13i1.69

Keywords:

Anomaly Detection Fault Diagnosis Time-Series Forecasting Reinforcement Learning Industrial Internet of Things

Abstract

Predictive maintenance (PdM) is a critical component of modern industrial systems, aiming to reduce downtime, enhance efficiency, and lower maintenance costs. With the increasing complexity of industrial equipment and the vast amounts of sensor data generated, traditional maintenance methods are no longer sufficient. Deep learning approaches have emerged as a powerful tool to address these challenges, offering enhanced capabilities for anomaly detection, fault prediction, and condition monitoring. This paper reviews the latest deep learning techniques applied to predictive maintenance in industrial systems, including convolutional neural networks (CNNs), recurrent neural networks (RNNs), autoencoders, and reinforcement learning models. We explore their application to time-series data, sensor data analysis, and fault diagnosis in various industrial contexts. Additionally, the integration of deep learning with Internet of Things (IoT) and Industrial Internet of Things (IIoT) frameworks is examined, highlighting the synergies between these technologies. We also discuss the challenges and limitations, such as data quality, model interpretability, and computational cost, as well as the potential future directions for research. This work underscores the transformative potential of deep learning in optimizing predictive maintenance practices and advancing the efficiency of industrial operations.

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Published

2025-04-15

How to Cite

Nolan , J., & Reynolds, S. (2025). Deep Learning Approaches for Predictive Maintenance in Industrial Systems. ITSI Transactions on Electrical and Electronics Engineering, 13(1), 20–25. https://doi.org/10.65521/itsi-teee.v13i1.69

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