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MRI India Journals Vol. 15 No. 1S (2026): Special Issue: Integration of AI Management Engineering and Technology

Neuro Vision: Deep Learning-Based Brain Tumor Identification

Authors

  • Shreya Nehe Department of Computer Engineering, Genba Sopanrao Moze College of Engineering, Pune, India
  • Renuka Gunjal Department of Computer Engineering, Genba Sopanrao Moze College of Engineering, Pune, India
  • Komal Mane Department of Computer Engineering, Genba Sopanrao Moze College of Engineering, Pune, India
  • Nafisa Desai Department of Computer Engineering, Genba Sopanrao Moze College of Engineering, Pune, India
  • Rudraksh Patil Department of Computer Engineering, Genba Sopanrao Moze College of Engineering, Pune, India

DOI:

https://doi.org/10.65521/ijeecs.v15i1S.3061

Keywords:

Convolutional Neural Networks Tumor Cells Denoising Wavelet Transform Diffusion Tensor Imaging Naive Bayes Classifier

Abstract

 

Early and accurate identification of brain tumours from MRI images is essential to prevent severe and life-threatening conditions. The complex nature of brain tissues makes tumour detection, segmentation, and classification a challenging process. Tumour differ in size, shape, texture, and position, which reduces the accuracy of traditional detection methods. In this paper, a deep learning-based system is introduced using Convolutional Neural Networks (CNNs) for automatic brain tumour analysis. Image enhancement techniques such as Denoising Wavelet Transform (DWT) and Diffusion Tensor Imaging (DTI) are applied to improve image clarity and feature extraction. The use of multimodal MRI scans provides detailed structural information, leading to better tumour segmentation and classification. The proposed system improves diagnostic accuracy and supports doctors in making faster and more dependable clinical decisions.

 

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Published

2026-05-22

How to Cite

Nehe, S., Gunjal, R., Mane, K., Desai, N., & Patil, R. (2026). Neuro Vision: Deep Learning-Based Brain Tumor Identification. International Journal of Electrical, Electronics and Computer Systems, 15(1S), 234–240. https://doi.org/10.65521/ijeecs.v15i1S.3061

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