MRI
MRI India Journals Vol. 15 No. 1S (2026): Special Issue: Integration of AI Management Engineering and Technology

Structural Analysis Of G+15 Building with Vertical Irregularities Using ETABS

Authors

  • Tejashri Gulve Assistant Professor, Dept. of civil Engineering DYPSEMR, DYPIU
  • Anuja Kawade Student, Dept. of Civil Engineering, DYPIEMR, (SPPU), Pune, Maharashtra
  • Harshada Kadam Student, Dept. of Civil Engineering, DYPIEMR, (SPPU), Pune, Maharashtra
  • Sneha Kawthe Student, Dept. of Civil Engineering, DYPIEMR, (SPPU), Pune, Maharashtra
  • Tanuja Waghalkar Student, Dept. of Civil Engineering, DYPIEMR, (SPPU), Pune, Maharashtra

DOI:

https://doi.org/10.65521/ijeecs.v15i1S.2953

Keywords:

Vertical Irregularity ETABS G+15 Building Seismic Analysis Storey Drift Base Shear

Abstract

Rapid urbanization and scarcity of land have led to the construction of high-rise buildings with complex architectural configurations. These configurations often imass, stiffness, and geometry, which significantly influence the seismic performance of structures. This research presents a detailed seismic analysis of a G+15 reinforced concrete (RCC) building with vertical irregularities using ETABS software. Regular and vertically irregular building models are developed and analyzed using the Response Specturm Method and Time History Method in accordance with IS 1893 (Part 1):2016 and IS 456:2000. Key response parameters such as base shear, storey drift, lateral displacement, shear force, and bending moment are evaluated. The results demonstrate that vertical irregularities lead to increased seismic demand and deformation, particularly near irregular zones. The study emphasizes the importance of careful structural configuration and advanced analysis to ensure seismic safety of high-rise buildings.

 

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Published

2026-05-19

How to Cite

Gulve, T., Kawade, A., Kadam, H., Kawthe, S., & Waghalkar, T. (2026). Structural Analysis Of G+15 Building with Vertical Irregularities Using ETABS. International Journal of Electrical, Electronics and Computer Systems, 15(1S), 36–45. https://doi.org/10.65521/ijeecs.v15i1S.2953

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