Edge AI-Driven IoT Architectures for Real-Time Data Processing in Cyber-Physical Smart Environments

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Sharyu Ikhar

Abstract

Edge Artificial Intelligence (Edge AI) has emerged as a powerful paradigm for enabling intelligent real-time analytics and autonomous decision-making in IoT-driven cyber-physical environments. The rapid expansion of IoT devices, smart sensors, industrial automation systems, healthcare platforms, and smart city infrastructures has generated massive volumes of heterogeneous data requiring low-latency processing and distributed intelligence. Traditional cloud-centric IoT architectures often face challenges such as communication delays, bandwidth limitations, centralized bottlenecks, and privacy concerns, making them less suitable for time-sensitive applications. To address these limitations, this research proposes an Edge AI-driven IoT architecture for real-time data processing in cyber-physical smart environments. The proposed framework integrates edge computing, distributed AI inference, deep learning-based analytics, IoT communication systems, and intelligent control mechanisms to support scalable and efficient processing at the network edge. The architecture incorporates lightweight convolutional neural networks, distributed sensor fusion, and real-time stream analytics to improve responsiveness, computational efficiency, and adaptive decision-making. The framework supports diverse applications including smart healthcare, intelligent transportation, industrial automation, environmental monitoring, smart grids, and autonomous infrastructures. Experimental results demonstrate that the proposed Edge AI framework significantly reduces latency, improves decision accuracy, enhances bandwidth utilization, increases scalability, and strengthens privacy preservation and fault tolerance compared to traditional cloud-based IoT systems.


 

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How to Cite
Ikhar, S. (2025). Edge AI-Driven IoT Architectures for Real-Time Data Processing in Cyber-Physical Smart Environments. International Journal of Advanced Electrical and Electronics Engineering, 14(2), 121–130. Retrieved from https://journals.mriindia.com/index.php/ijaeee/article/view/2732
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