REYNOLDS, Susan; NOLAN, James. Automated Reverse Engineering using Machine Learning. ITSI Transactions on Electrical and Electronics Engineering, [S. l.], v. 11, n. 1, p. 17–22, 2025. DOI: 10.65521/itsi-teee.v11i1.156. Disponível em: https://journals.mriindia.com/index.php/itsiteee/article/view/156. Acesso em: 4 apr. 2026.