SINCLAIR, Kevin; MEHTA, Harish. Machine Learning for Detecting Insider Data Theft. ITSI Transactions on Electrical and Electronics Engineering, [S. l.], v. 11, n. 1, p. 11–16, 2025. Disponível em: https://journals.mriindia.com/index.php/itsiteee/article/view/155. Acesso em: 14 sep. 2025.