Sheela , M. Asha Aruna, et al. “IntegriScan: A Graph-Aided Model for Detecting Corrupted and Anomalous Data Patterns”. International Journal of Recent Advances in Engineering and Technology, vol. 14, no. 1, Apr. 2025, pp. 71-78, https://journals.mriindia.com/index.php/ijraet/article/view/181.