EKATPURE, Jalindar Nivrutti; EKANDE, Sonali; KOKARE, Mayur; MULANI, Tabasum; PATIL, Geeta. Decentralized Evidence Management and AI-Assisted Forensic Sketch Generation System. International Journal of Electrical, Electronics and Computer Systems, [S. l.], v. 15, n. 1, p. 86–90, 2026. Disponível em: https://journals.mriindia.com/index.php/ijeecs/article/view/3406. Acesso em: 7 jun. 2026.