KATHAR, Smita; JAGTAP, Omkar; RANADIVE, Prathmesh; CHACHAR, Lalit; MEHTRE, Sonal. Crop Yield Prediction Using Machine Learning. International Journal of Electrical, Electronics and Computer Systems, [S. l.], v. 15, n. 1S, p. 241–244, 2026. DOI: 10.65521/ijeecs.v15i1S.3062. Disponível em: https://journals.mriindia.com/index.php/ijeecs/article/view/3062. Acesso em: 24 jul. 2026.