EVANS, T. K.; POPESCU, V.; AHMED, S. A Review of Temperature-Dependent Encryption Scaling in IoT Chipsets: Intelligent Modeling, Electronics Integration, and Real-World Applications. International Journal of Electrical, Electronics and Computer Systems, [S. l.], v. 14, n. 2, p. 162–168, 2025. DOI: 10.65521/ijeecs.v14i2.2134. Disponível em: https://journals.mriindia.com/index.php/ijeecs/article/view/2134. Acesso em: 24 jul. 2026.