KHANDARE , Ram N.; NAGVEKAR , Yogesh; GAJARE , Khushi; AHEI , Gargi. A review paper on An Analysis of AI-Assisted Automatic PCB Defect Identification. International Journal on Advanced Computer Theory and Engineering, [S. l.], v. 14, n. 1, p. 627–631, 2025. Disponível em: https://journals.mriindia.com/index.php/ijacte/article/view/613. Acesso em: 14 sep. 2025.