J, Rathan; NAIK T, Harisha. A Survey on Intelligent Surveillance Systems for Classification of Usual and Unusual Events Using Deep Learning Models. International Journal on Advanced Computer Engineering and Communication Technology, [S. l.], v. 15, n. 2, p. 292–315, 2026. Disponível em: https://journals.mriindia.com/index.php/ijacect/article/view/4701. Acesso em: 16 oct. 2026.